Morphological and structural characterization of Rare-Earth doped ZnO for EMI shielding applications
- Brîncoveanu O., Romanițan C., Pascariu P., Manica M., Barbu L., Tripon S., Suchea M. „Morphological and structural characterization of Rare-Earth doped ZnO for EMI shielding applications” IEEE 2025 International Semiconductor Conference (CAS), Octombrie 2025.
- https://doi.org/10.1109/CAS66707.2025.11222373
Abstract:
The morphological and structural properties of metal oxide-based materials play a crucial role in their performance for electromagnetic interference (EMI) shielding applications. In this study, ZnO doped with La, Er, and Sm was synthesized using the electrospinning method and characterized through scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray spectroscopy (EDX) and X-ray diffraction (XRD). SEM and TEM analyses revealed that the ZnO structures consist of a mixture of nanoparticles and nanorods, with variations in length and diameter depending on the dopant type. EDX confirmed that the dopant uniformly distributes into ZnO lattice and doping levels closely matched the intended values. Interplanar distances were calculated from TEM images providing further insights into structural modifications induced by doping. These findings contribute to a better understanding of the structural evolution of doped ZnO and highlight its potential for improved dielectric properties and superior EMI shielding performance.
Date of Conference: 07-11 October 2025
Date Added to IEEE Xplore: 06 November 2025